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Join us in Singapore


PAM APAC 2026

September 21-22 | Singapore

Intelligent defect analysis software

At PAM APAC we'll be showcasing the next generation of Veryon Defect Analysis, our solution for identifying, clustering, and analyzing repeat aircraft defects.

More insight. Smarter decisions. Better operational efficiency.

Pre-book a demo

Attend our presentation

Same Defect, Three Opinions

Why Fleet-Wide Evidence Beats Individual Judgement

The reality is every MCC, line maintenance, and reliability team makes rational calls with partial context, and that's exactly the problem. A defect shows up worded three different ways, gets three different verdicts, and comes back anyway. The fix isn't more dashboards or more charts. It's connecting those three write-ups to the same underlying pattern. We'll show you how Veryon Defect Analysis solves the problem.

11:20 | September 21

Dave Purfurst | Veryon

Dave Purfurst
Director, Solutions Consultant | Veryon

Meet our team 

Dave Purfurst

Dave Purfurst

Director, Solutions Consultant

Khalid Mutlaq

Khalid Mutlaq

Account Executive

Shreeya Sairam | Veryon

Shreeya Sairam

Manager, Enterprise Customer Success